A BIST Scheme for Dynamic Comparators
نویسندگان
چکیده
This paper proposes a built-in self-test (BIST) scheme for detecting catastrophic faults in dynamic comparators. In this scheme, feedback loop is designed using the characteristics of comparator; monitoring voltage can determine presence circuit fault. The proposed BIST and under testing are realized at transistor level. was simulated HSPICE. fault coverage approximately 87.8% with 90 test circuits. To further verify effectiveness six were injected into real circuit. results consistent simulation results.
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ژورنال
عنوان ژورنال: Electronics
سال: 2022
ISSN: ['2079-9292']
DOI: https://doi.org/10.3390/electronics11244169